interferometer can be used to measure displacement figure la shows the schematic layout of a mic

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Interferometer can be used to measure displacement. Figure 1a shows the schematic layout of a Michelson interferometer. The laser source emits at a wavelength of 650 nm. Mirror MI is mounted on a fixed stage, while mirror M2 is mounted on a PZT transducer and can be moved back and forth along the light beam axis. It is found that when M2 is moved by a distance of D, the interference pattern displayed on the screen shifts 200 fringes in total. Calculate the value of D. When a thin piece of transparent material T is placed in front of M2 (as shown in Figure 1b), the interference pattern further shifts by 1000 fringes. Suppose the refractive index of T is 1.52, calculate its thickness. M1 (Fixed mirror) (b) M1 (Fixed mirror) Moving direction Laser source PZT Laser source PZT M2 (Movable mirror) M2 (Movable mirror) Screen Screen Figure 1

          Interferometer can be used to measure displacement. Figure 1a shows the schematic layout of a Michelson interferometer. The laser source emits at a wavelength of 650 nm. Mirror MI is mounted on a fixed stage, while mirror M2 is mounted on a PZT transducer and can be moved back and forth along the light beam axis. It is found that when M2 is moved by a distance of D, the interference pattern displayed on the screen shifts 200 fringes in total. Calculate the value of D. When a thin piece of transparent material T is placed in front of M2 (as shown in Figure 1b), the interference pattern further shifts by 1000 fringes. Suppose the refractive index of T is 1.52, calculate its thickness.

M1 (Fixed mirror)
(b)
M1 (Fixed mirror)
Moving direction
Laser source
PZT
Laser source
PZT
M2 (Movable mirror)
M2
(Movable mirror)
Screen
Screen

Figure 1

interferometer can be used to measure displacement figure la shows the schematic layout of a michelson interferometer the laser source emits at a wavelength of 650 nm mirror mi is mounted on 70203

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