Let's consider a silicon sample with unit cross sectional area as shown in the Figure 1, which is in thermal equilibrium. The following information is given:
\( \mathrm{T}=300 \mathrm{~K} \), Electronic charge \( =1.6 \times 10^{-19} \mathrm{C} \), Thermal voltage \( =26 \mathrm{mV} \)
Electron mobility \( =1350 \mathrm{~cm}^{2} / \mathrm{V} \)-s
(a) Find the magnitude of the electric field at \( \mathrm{x}=0.5 \mu \mathrm{~m} \)
[3 marks]
(b) Find the magnitude of the electron drift current density at \( \mathrm{x}=0.5 \mu \mathrm{~m} \)
[3 marks]
Figure 1
(c)
Let's assume electronic charge \( (\mathrm{q})=1.6 \times 10^{-19} \mathrm{C}, \mathrm{kT} / \mathrm{q}=25 \mathrm{mV} \) and electron mobility \( \left(\mu_{\mathrm{n}}\right)=1000 \mathrm{~cm}^{2} / V \)-s. If the concentration gradient of electrons injected into a p-type silicon sample is \( 1 \times 10^{21} \mathrm{~cm}^{-4} \), then find the magnitude of the electron diffusion current density (in \( \mathrm{A} / \mathrm{cm}^{2} \) ). \( \mathrm{k}= \) Boltzmann constant,
\( \mathrm{T}= \) absolute degree temperature
[4 marks]