Q.1 (a) GaP has an indirect bandgap of 2.26 eV and its relative dielectric constant ̵r = 10. Calculate the photon energy (in eV) of a shallow donor to shallow acceptor transition in GaP if the donor and acceptor impurity separation is 20
. Given the donor and acceptor energy levels at ground states of GaP are 0.107 eV and 0.210 eV, respectively.
(b) Burstein-Moss shift (BMS) is the phenomenon of which the Fermi level moves into the conduction band in degenerate semiconductors. As a result, the absorption edge shifts to a higher energy as doping concentration increases. Give two reasons why you could not make GaAs with a bandgap of 1.43 eV to emit in the wavelength of 400 nm by simply increasing the doping concentration. The electron and hole effective masses of GaAs are given as mᵉ* = 0.067m₀ and mₕ* = 0.54 m₀, respectively.
(c) The conduction band (CB) minimum of Si occurs at the (100) valley and has a wave-vector k(0.85, 0, 0)2π/a where the lattice constant a = 0.5431 nm. A conduction band electron in Si is located in the (100) valley and has a wave-vector k(1.0, 0.1, 0.1)2π/a. The longitudinal and transverse effective masses of electron are 0.98m₀ and 0.19m₀, respectively, where m₀ is the electron rest mass. Calculate the energy of this electron measured from the CB minimum.
(d) InN semiconductor has a direct bandgap of 0.77 eV and a relative dielectric constant εr = 15.3. The electron and hole effective masses of InN are mᵉ* = 0.11m₀ and mₕ* = 1.63 m₀, respectively.
(i) Calculate the InN free exciton binding energy and its exciton Bohr radius.
(ii) Estimate the temperature in which the exciton will be dissociated into an unbound electron-hole pair.
(e) Explain what are physical properties determine the critical layer thickness of a semiconductor alloy to be epitaxially grown on a substrate