Home Work
1. A bin of 5 transistors is known to contain 3 that are defective. The transistors are to
be tested, one at a time, until the defective ones are identified. Denote by NI the
number of tests made until the first defective is spotted and by N2 the number of
additional tests until the second defective is spotted; find the joint probability mass
function of N1 and N2.