With reference to TDI and TDO explain how these ports may be arranged around a piece core logic to allow boundary scan testing
Explain how the I/O ports may be configured as an input port with input data scanned into the cell for testing the core logic of an integrated circuit.
Explain how the I/O port may be configured as an output port for capturing data from the core logic of an integrated circuit.
Explain how these ports may be arranged for testing printed circuit board interconnections between pins of an integrated circuit.