(e) An n-type In_(0.53)Ga_(0.47) As epitaxial layer doped at 10^(16)cm^(-3) is to be used as a channel in a FET operating at 300K. A decision is to be made whether the JFET or MESFET technology is to be used for the device. In the JFET technology a p^(+) region can be made with a doping of 5\\times 10^(17)cm^(-3). In the MESFET technology a Schottky barrier with a height of 0.4V is available.\nThe materials parameters are:\nD_(p)=20c(m^(2))/(s),D_(n)=50c(m^(2))/(s),L_(p)=5\\mu m,L_(n)=5\\mu m,n_(i)=2.3710^(11)cm^(-3),\nA^(**)=5Acm^(-2)K^(-2)\n(i) Calculate the reverse saturation current for JFET.\n[2]\n(ii) Calculate the reverse saturation current for the MESFET.\n1\n(iii) Considering gate isolation issues, which technology should be used?\n[1]
(e) An n-type Ino.53Gao.47As epitaxial layer doped at 1016 cm-3 is to be used as a channel in a FET operating at 300 K. A decision is to be made whether the JFET or MESFET technology is to be used for the device. In the JFET technology a p region can be made with a doping of 51017 cm-3. In the MESFET technology a Schottky barrier with a height of 0.4 V is available.
The materials parameters are: Dp=20cm2/s,Dn=50cm2/s,Lp=5um,Ln=5um,ni=2.371011cm3 A*=5Acm-2K2 (i) Calculate the reverse saturation current for JFET. (ii) Calculate the reverse saturation current for the MESFET (iii) Considering gate isolation issues, which technology should be used?
[2] [1] [2]