For a n-channel MOSFET with gate oxide thickness of $20 \mathrm{~nm}$, calculate the required phosphorous ( $\mathrm{P}$ ions $/ \mathrm{cm}^{2}$ ) to be doped to reduce the threshold voltage from $1.5 \mathrm{~V}$ to $1 \mathrm{~V}$. If the $\mathrm{P}$ ion implantation takes place for 15 seconds with a beam current of amount $10^{-6}$ Amp, then what scan area will be covered by the implanted beam?