You are a semiconductor device modeling consultant and you are asked to recommend strategies to increase the current IDS of a new MOSFET for a given VGS and VDS without increasing the width of the device. Which of the following statements are correct recommendations?
Select a material for the oxide with lower permittivity, decrease the thickness of the oxide layer, decrease the channel length, increase the mobility of the carriers by using an n-channel instead of a p-channel device, and attempt to decrease the threshold voltage.
Select a material for the oxide with higher permittivity, decrease the thickness of the oxide layer, decrease the channel length, increase the mobility of the carriers by using an n-channel instead of a p-channel device, and attempt to decrease the threshold voltage.
Select a material for the oxide with higher permittivity, decrease the thickness of the oxide layer, decrease the channel length, decrease the mobility of the carriers by using a p-channel instead of an n-channel device, and attempt to decrease the threshold voltage.
Select a material for the oxide with higher permittivity, decrease the thickness of the oxide layer, decrease the channel length, increase the mobility of the carriers by using an n-channel instead of a p-channel device, and attempt to increase the threshold voltage.